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What does the future hold for test & measurement?
Are the days of standalone oscilloscopes and logic analysers numbered?
How can you deal with the complex issues involved in wireless test?
Will a software based approach dominate inthe future?
What is functional test and how might it fit into your test enviroment?
Get the answers to these and other questions from the specialist presentations at the New Electronics' Test & Measurement Design Day and from the table top exhibition.
This will be an ideal opportunity for design engineers notonly to update their test & measurement knowledge, but also to get a 'hands on' view of where the sector is heading.
| 09:00 | Registration, coffee & exhibition |
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| 09:45 | Keynote address
MIL/AERO test challenges
Donald Blyth, Chief Test Engineer, Selex-SAS Edinburgh. |
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| Track 1 | Track 2 | Track 3 |
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| 10:15 | National Instruments
Synthetic instruments | Anritsu
Wireless test | Yokogawa
Embedded test |
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| 11:00 | Coffee & exhibition |
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| 11:30 | QualiSystems
Functional test automation | Agilent
Wireless test | Tektronix
Embedded test |
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| 12:30 | Lunch |
| 13:30 | Hands on workshops (25 minute repeating sessions)
Anritsu
National Instruments
QualiSystems
Yokogawa |
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| 15:30 | Close |
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